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Brochure CellaTemp PX

Industry	Crystal growing
Application	Multi-crystalline silicon
Identifier	Crystal growing-Multi-crystalline silicon
Measuring location	Crucible
Measuring point number	1
Messsystemnummer	1106159
Anmerkung	Through-the-lens sighting
Selection criterion	IO-Link interface
Applikations Text	Special calibration for silicon (Si) enables very high measuring accuracy at the working temperature exact alignment by means of integrated video camera or through-the-lens sighting

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